v.0.7.0
Release date: 06/05/2026
New features
- Pattern-based layout composition in Etch (Experimental). Read more
- Patterns and Pattern Categories UI with context and management controls
- Related Skills and MCP Tools
- New MCP Tool for live site CSS variable introspection
Improvements
- Added stricter payload validation in Settings API requests
- Registered unify-lightness palette toggles as patchable
- Removed the Patch Validator 200-key hard limit
- Other micro improvements in plugin UI
Bug Fixes
- Several minor fixes in code and context